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IEC 60065 Standard

HK LEE HING INDUSTRY CO., LIMITED

City: Shenzhen

Province/State: Guangdong

Country/Region: China

Contact Person: Nina She

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IEC 60529 Test Finger Probe B with 10N Force for IPX Test Equipment Force Level: 10N 1. Conforms to: Standard IEC 61032-1997, IEC 60529-2001, GB/T4208...
UL6500 Figure B.1 / IEC60950-1 Figure 2C - Test Probe Telekom Sonde Purpose: Telecom-Test Probe meets IEC60950 Figure 2C and UL6500 Figure B.1 ...
UL1278 / UL1026 / UL507 Figure 8.2 S2140A Unjointed Rigid Finger Test Probe for Fan Impellers and other Moving Parts Technical parameters: 1. Straight ...
IRAM 2092, AS/NZS/EN/SASO/IEC 60335 Test Probe Kit of Test Probe B, Test Probe 11, Test Probe 12, Test Probe 13, Test Probe 41 Meets IEC 60335. ...
IEC60884 Figure 9 Gauge with 20N Force for Checking Non-Accessibility of Live Parts, Through Shutters Application: Gauge: 80mm long, 20 N force. ...
SASO/IEC 60335-1, SASO IEC 60950, IEC 60950/EN60950 Non-Jointed Test Finger for Test Accessibility of Internal Conductive Parts The Rigid Test Finger ...
IEC/EN 61032 Figure 3 2.5 mm Test Rod with 3N Thrust & IEC/EN 61032 Figure 4 1.0 mm Test Wire with 1N Thrust Basic Introduction: 1. According to: GB...
Test Probe 12 Long Test Pin of IEC 61032 Fig. 8 / Test Probe 13 Short Test Pin of IEC 61032 Fig. 9 Appliance: It's the necessary tool to proceed ...
IEC EN 61010 Test Probe Kit of Rigid Test Finger & Test Pins & Test Thorn Meets IEC 61010. Accessibility probes are used to test the size of openings ...
IEC60884-1 Figure 10 Gauge with 1N Force for Checking Non-Accessibility of Socket-Outlets with Increased Protection Application: Gauge: 80mm long, 1N ...
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