HK LEE HING INDUSTRY CO., LIMITED
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IEC 60065 Standard

HK LEE HING INDUSTRY CO., LIMITED

City: Shenzhen

Province/State: Guangdong

Country/Region: China

Contact Person: Nina She

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Meets IEC CSA & UL requirements Test Probe 13 of Short Test Pin - Fig. 9 of EN 61032 IEC 61032 Test Probe 13 meets IEC CSA & UL requirements This pin ...
IEC 61032:1997 / IEC 61032:2008 / BS EN 61032:1998 / CEI 61032:1998 IP1X Test Probe A with 50N Thrust Specification: IP1X Probe A /Test Probe A 1, ...
UL1082 / UL1017 / UL1062 / UL982 / UL474 / UL60065 / UL6500 / UL1278 / UL507 Figure9.2 PA100A of UL Articulate Probe Test Finger Articulate probe with ...
IEC61032 Test Probe 18, Children Test Finger Probe This probe is intended to simulate access to hazardous parts by children of more than 36 months and ...
ANSI/IEC 60529 Degrees of Protection Provided By Enclosures IP Code Full Set of Test Probe Kit with Test Force Meets ANSI/IEC 60529. Accessibility ...
IRAM 4029 / EN UL SASO IEC 60065 Test Probe Kit of Unjointed Finger Probe SM970C & Test Hook SM1065 & Impact Test Steel Ball Meets IEC 60065. ...
BS EN 61032:1998 Figure 13 - Child Finger Test Probe 19 of Small Finger Probe 5,6 mm (0~36 months) Specification: Children Test Finger / Children Test ...
GB4706.1-2005 Test Probe Kit of Jointed Finger Probe | Test Pin Probe | Test Thorn Probe Meets GB4706.1-2005. Accessibility probes are used to test ...
IEC 60529 / EN 60529 Test Probe Kit of Access Probes for The Tests for Protection of Persons Against Access to Hazardous Parts Meets IEC 60529. ...
IRAM 4220 / CEI EN IEC 60601 Test Probe Kit of Standard Test Finger & Test Hook & Test Pin Meets IEC 60601. Accessibility probes are used to test the ...
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