IEC Jointed and Unjointed Test Finger

The Jointed Test Finger & Unjointed Test Finger is a precision test probe made according to Figure 2 (Test Probe B) and Figure 7 (Test Probe 11) of the IEC 61032 is used to simulate a human finger, used by the standards of IEC, CSA, IRAM, UL etc.




1) IEC Jointed Test Finger ( Test Probe B of IEC 61032)
Test Probe Diameter: 12 mm
Test Probe Length: 80 mm
Baffle Plate Thickness: 20 mm
Baffle Plate Diameter: 50 mm
Baffle Plate Length: 100 mm





2) IEC Unjointed Test Finger ( Test Probe 11 of IEC 61032)
Test Probe Diameter: 12 mm
Test Probe Length: 80 mm
Baffle Plate Thickness: 5 mm
Baffle Plate Diameter: 50 mm

HK LEE HING INDUSTRY CO., LIMITED are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.

Main Products: Go No Go Gauges, IP Tester, Test Probe Kit, Impact Test Equipment, Test Probes, Spring Hammer, IEC 61032 Test Finger, AC Hipot Tester, IEC Test Probe, UL Test Probe, Material Flammability Tester, IP Code Tester, Impact Test Apparatus, Security Testing Machine, Plugs and Socket Outlet Gauge, Lamp Cap Gauge Tester, Lampholders Gauge Tester, Plug & Socket Tester, Electrical Safety Tester, LED Test Instruments, Environmental Test Equipment, Instrument Accessories, Weighing Sensor and More.
If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.
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IEC Jointed and Unjointed Test Finger Images